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Oral presentation

Interface analysis of $$beta$$-FeSi$$_{2}$$ thin films on ion irradiated Si with atomic resolution by scanning transmission electron microscope

Sasase, Masato*; Yamamoto, Hiroyuki

no journal, , 

Interface analysis of $$beta$$-FeSi$$_{2}$$ thin films on ion irradiated Si has been attempted by scanning transmission electron microscope with atomic resolution.

Oral presentation

Formation of fullerene-like structure by low-energy ion beam doping

Shimoyama, Iwao; Baba, Yuji; Sekiguchi, Tetsuhiro; Uddin, M. N.*; Nagano, Masamitsu*

no journal, , 

Carbon alloys formed by B and N dopings is expected for some applications, e.g., catalyst and semiconductor. However, the relationship between doping and material properties is not clear enough because of complicated structures around dopant atoms due to various chemical conditions between ternary system of B, C, and N. We measured polarization dependence of near-edge X-ray absorption fine structure (NEXAFS) to investigate configuration of local structure around dopant atoms in BN co-doped graphite. B and N K-edge NEXAFS spectra showed graphite-like polarization dependence and some $$pi$$* peaks in the spectra showed different magnitude of polarization dependence. This indicates existence of local structures which have distorted planar configuration. We propose a fullerene-like structure for the distorted planar configuration based on comparison of structure stability calculated by a molecular orbital theory with model clusters.

Oral presentation

Synchrotron radiation photoemission study on native oxides of VCrTi alloy and its modification by deuterium ion implantation

Teraoka, Yuden; Harries, J.; Tode, Mayumi; Yoshigoe, Akitaka

no journal, , 

Native oxides of VCrTi alloy, their thermal stability and their modification via deuterium ion implantation have been investigated using synchrotron radiation photoemission spectroscopy. The oxide thickness was estimated to be 3 nm by photon energy dependence (600 eV - 1600 eV). Its thermal stability was investigated by flash heating from 473 K to 1173 K. O1s, C1s, V2p, Cr2p, and Ti2p were measured after cooling down below 373 K. Before heating, major peaks of metal oxides were observed at 1247 eV as well as minor peaks showing their bulk contribution. After only 473 K heating, the metal peaks grew with O1s decrease. The same kind experiments were performed for deuterized samples with dose of 2.8$$times$$10$$^{15}$$ cm$$^{-2}$$. Photoemission peaks after 373 K heating were almost same as before heating in contrast to the non-ion-implanted sample. D$$_{2}$$ desorption was observed by a mass spectrometer during 573 K heating. Consequently, the native oxide decomposeD thermally after D$$_{2}$$ desorption.

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